Product Introduction
HSPM-05PS Room Temperature Probe Bench Hall Test System can provide a fixed magnetic field test environment for precision tiny (nano-scale) microelectronic devices, the sample under test will be magnified through a microscope, and zapped with a high-precision microprobe, and externally connected to the Hall measuring instrument can be used for Hall testing and analysis.
The HSPM-05PS Room Temperature Probe Hall Test System provides a vertical magnetic field environment for samples and devices up to 8 inches under test. External connection of other electrical measurement instruments can be used to perform non-destructive electrical tests on chips, wafers and devices at room temperature, such as current, voltage, resistance and other electrical signals under different magnetic fields.
System Features:
-Stable dual displacement adjustment system for sample holder and probe arm displacement.
-Sample holders can hold wafer samples up to 8 inches with porous zoned controlled gas adsorption fixation.
-Automatically control the forward and backward movement of the permanent magnet and N.S. pole flip, and can be accurately positioned, the magnetic field size of 0.5T
-Up to 6 probe arms can be installed.
The probe arms are adsorbed by magnets, which can be moved arbitrarily and can be fine-tuned in three dimensions for easy operation and precise pinning, and the probes of the four probe arms can be pinned to any position of the samples.
-The probe arm adopts three coaxial cables and three coaxial connectors, the leakage current is small, within 100fA.
-Maximum magnification of CCD is 180 times, and the maximum working distance is 100mm.
Test material:
- Thermoelectric materials: bismuth telluride, lead telluride, silicon germanium alloy, etc.
- Photovoltaic materials/solar cells: (A silicon (monocrystalline silicon, amorphous silicon), CIGS (copper indium gallium selenide), cadmium telluride, chalcogenide, etc.)
- Organic Materials: (OFET, OLED)
- Transparent Conductive Metal Oxide TCO: (ITO, AZO, ZnO, IGZO (Indium Gallium Zinc Oxide), etc.)
- Semiconductor materials: SiGe, InAs, SiC, InGaAs, GaN, SiC, InP, ZnO, Ga2O3 and so on
- Two-dimensional materials: graphene, BN, MoS2, etc.
