Electromagnet Variable Field Probe Station Hall Test System HSEM-06PS
HSEM-06PS Room Temperature Variable Field Probe Bench Hall Test System can be placed up to 4 inches of wafer samples, the use of porous zoning control gas adsorption fixation, can provide a variable magnetic field environment, the magnetic field size of ± 0.6T , can be installed 6 probe arm. External connection to other electrical instrumentation can be at room temperature on the chip, wafer and device for non-destructive electrical testing, such as current, voltage, resistance and other electrical signals under different magnetic fields.
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